Integrated Green-niX Seminar Series
Methods of measurement, benchmarking, and techniques for reducing parasitic external resistance of advanced transistors
Lecturer:
Dr. Oleg Gluschenkov,
Senior Technical Staff at IBM Semiconductor Technology Research
Date: 14:00-15:00, September 27th, 2024
Venue: Zoom and On-site
Dr. Oleg Gluschenkov
Senior Technical Staff at IBM Semiconductor Technology Research
Dr. Oleg Gluschenkov is a Senior Technical Staff Member and a Master Inventor at the IBM Research at Albany NanoTech, responsible for driving down components of transistor external resistance. At IBM, he has made technical contributions in the areas of non-planar transistors, meta-stable materials, laser annealing, process-layout interactions, poly-metal gates, and wafer distortions. He received his M.S. and Ph.D. degrees in Electrical Engineering from the University of Illinois at Urbana-Champaign. He holds over 250 U.S. patents and has co-authored over 50 scientific publications and received IBM Corporate Patent Portfolio Award and several Outstanding Technical Achievement and Research Accomplishment Awards.
Registration
Please register your name and email address on the following site in advance.
Register Form Site
Venue
Zoom site and Real site
Ookayama Campus W9-2F Collaboration Room, Tokyo Institute of Technology
Inquiry
knc.info@m.titech.ac.jp
Integrated Green-niX Consortium for Research and Human-Resource Development
Integrated Green-niX+ Research Unit,
Tokyo Institute of Technology