Integrated Green-niX Seminar Series

Methods of measurement, benchmarking, and techniques for reducing parasitic external resistance of advanced transistors

Lecturer:
Dr. Oleg Gluschenkov,
Senior Technical Staff at IBM Semiconductor Technology Research

Date: 14:00-15:00, September 27th, 2024
Venue: Zoom and On-site

Dr. Oleg Gluschenkov
Senior Technical Staff at IBM Semiconductor Technology Research

Dr. Oleg Gluschenkov is a Senior Technical Staff Member and a Master Inventor at the IBM Research at Albany NanoTech, responsible for driving down components of transistor external resistance. At IBM, he has made technical contributions in the areas of non-planar transistors, meta-stable materials, laser annealing, process-layout interactions, poly-metal gates, and wafer distortions. He received his M.S. and Ph.D. degrees in Electrical Engineering from the University of Illinois at Urbana-Champaign. He holds over 250 U.S. patents and has co-authored over 50 scientific publications and received IBM Corporate Patent Portfolio Award and several Outstanding Technical Achievement and Research Accomplishment Awards.

Registration

Please register your name and email address on the following site in advance.
Register Form Site


Venue

Zoom site and Real site
Ookayama Campus W9-2F Collaboration Room, Tokyo Institute of Technology


Inquiry

knc.info@m.titech.ac.jp
Integrated Green-niX Consortium for Research and Human-Resource Development
Integrated Green-niX+ Research Unit,
Tokyo Institute of Technology